翻訳と辞書 |
scanning acoustic microscope : ウィキペディア英語版 | scanning acoustic microscope
A scanning acoustic microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called scanning acoustic tomography). It is commonly used in failure analysis and non-destructive evaluation. It also has applications in biological and medical research. The semiconductor industry has found the SAM useful in detecting voids, cracks, and delaminations within microelectronic packages. ==History== The first scanning acoustic microscope was developed in 1974 by R. A. Lemons and C. F. Quate at the Microwave Laboratory of Stanford University. Since then, many improvements to such systems have been made to enhance resolution and accuracy.
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「scanning acoustic microscope」の詳細全文を読む
スポンサード リンク
翻訳と辞書 : 翻訳のためのインターネットリソース |
Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.
|
|